Degradation kinetics of GaAs quantum well lasers

Abstract
Degradation-induced dark line defect growth velocities have been found to be inversely proportional to the operating temperature in quantum well lasers under current injection. A model has been developed, which considers the differing band structure and role of deep levels in quantum well structures as opposed to conventional double-heterostructure lasers. Our findings have significant implications for device yield since they suggest nontraditional screening strategies that recognize temperature as a decelerant for the sudden failure mode.