Using proton-induced X-rays to determine three parameters of the depth profile of foreign atoms in bulk material
- 1 March 1978
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 149 (1-3), 441-444
- https://doi.org/10.1016/0029-554x(78)90905-9
Abstract
No abstract availableKeywords
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