Scanning Surface Potential Microscopy for Local Surface Analysis
- 1 November 1992
- journal article
- research article
- Published by Oxford University Press (OUP) in Chemistry Letters
- Vol. 21 (11), 2223-2226
- https://doi.org/10.1246/cl.1992.2223
Abstract
A Scanning Surface Potential Microscopic (SSPM) instrument was built by modifying a commercial atomic force microscope (AFM), Seiko SFA 300 with a SPI 3600 probe station. Distribution of surface potentials on test samples microlithographically prepared and on mixed Langmuir-Blodgett (LB) films coated on a vapor-deposited gold film could be imaged in a x-y spatial resolution less than 1 μm and compared with AFM images observed on the same samples.Keywords
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