Material Characterization by Line-Focus-Beam Acoustic Microscope
- 1 March 1985
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Sonics and Ultrasonics
- Vol. 32 (2), 189-212
- https://doi.org/10.1109/t-su.1985.31586
Abstract
No abstract availableKeywords
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