Energy levels of dangling-bond centres in a-Si:H studied by photocapadtance transient spectroscopy
- 1 March 1987
- journal article
- research article
- Published by Taylor & Francis in Philosophical Magazine Letters
- Vol. 55 (3), 135-141
- https://doi.org/10.1080/09500838708228745
Abstract
The energy level spectrum of gap states in P-doped a-Si: H has been determined using photo-isothermal capacitance transient spectroscopy (ICTS) with sub-bandgap excitation. Photocapadtance transients were observed in the range from the bandgap energy down to 0·5 eV. It has been deduced that two gap-state features exist in the mobility gap; one is 0·5−0·6 eV below the mobility edge (E c) of the conduction band, and the other 1·0−1·2 eV below E c. These results are consistent with our previously reported results on ICTS as well as with defect PL, which were explainedin terms of ‘isolated’ and ‘charge-coupled’ doubly occupied dangling bonds (D−,∗D−).Keywords
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