A Ferroelectric Thin Film Technology For Low-voltage Nonvolatile Memory
- 1 January 1993
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Microscopic modeling of thin-film ferroelectrics: FatigueFerroelectrics, 1991
- Impact of Polarization Relaxation on Ferroelectric Memory PerformancePublished by Institute of Electrical and Electronics Engineers (IEEE) ,1991