A time-domain network analyzer which uses optoelectronic techniques
- 13 January 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 217-220 vol.1
- https://doi.org/10.1109/mwsym.1989.38704
Abstract
The performance of characterization measurements using time-domain optoelectronic techniques is shown to offer many advantages and to be especially suited for the on-wafer probing of GaAs integrated circuits. A single measurement can provide broadband scattering parameters. Signal generation is achieved by the illumination of a biased picosecond photoconductor with a short optical pulse and sampling by either a photoconductive or electrooptic technique. A comparison of results using both optical sampling techniques and frequency domain measurements is made. Results are presented for example tests performed on a 28-GHz MMIC (monolithic microwave integrated circuit). Reasonable agreement was obtained in the amplitude, with some discrepancy being evident in the phase.<>Keywords
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