A time-of-flight atom-probe field-ion microscope for the study of defects in metals
- 31 May 1976
- journal article
- Published by Elsevier in Scripta Metallurgica
- Vol. 10 (5), 485-488
- https://doi.org/10.1016/0036-9748(76)90178-2
Abstract
No abstract availableKeywords
This publication has 13 references indexed in Scilit:
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