An important step in quantitative auger analysis: The use of peak to background ratio
- 2 March 1984
- journal article
- Published by Elsevier in Surface Science
- Vol. 138 (2-3), 610-628
- https://doi.org/10.1016/0039-6028(84)90269-3
Abstract
No abstract availableKeywords
This publication has 19 references indexed in Scilit:
- Backscattering correction for quantitative Auger analysis III. A simple functional representation of electron backscattering factorsSurface Science, 1983
- A secondary electron emission correction for quantitative auger yield measurementsSurface Science, 1980
- Quantitative Auger electron spectroscopy: Via the energy spectrum or the differential?Surface and Interface Analysis, 1979
- A Monte-Carlo calculation of the secondary electron emission of normal metalsSurface Science, 1979
- A Monte-Carlo calculation of the secondary electron emission of normal metals: I. The modelSurface Science, 1979
- Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solidsSurface and Interface Analysis, 1979
- Quantitative approach of Auger electron spectrometry: I. A formalism for the calculation of surface concentrationsSurface Science, 1977
- Quantitative approach of Auger electron spectrometry: II. Experimental partSurface Science, 1977
- Deconvolution techniques in Auger electron spectroscopySurface Science, 1971
- A simple model for the dependence of Auger intensities on specimen thicknessSurface Science, 1969