Analysis of solids by secondary ion and sputtered neutral mass spectrometry
- 1 August 1985
- journal article
- research article
- Published by Springer Nature in Applied Physics A
- Vol. 37 (4), 211-220
- https://doi.org/10.1007/bf00614819
Abstract
No abstract availableThis publication has 37 references indexed in Scilit:
- Quantitative Secondary Neutral Mass Spectrometry Analysis of Alloys and Oxide-Metal-InterfacesPublished by Springer Nature ,1983
- Optimum sample utilization in secondary ion mass spectrometryNuclear Instruments and Methods in Physics Research, 1981
- Comparative SNMS and SIMS studies of oxidized Ce and GdSurface Science, 1979
- Energy distributions of sputtered copper neutrals and ionsJournal of Vacuum Science and Technology, 1978
- Sputtered neutral mass spectrometry (SNMS) as a tool for chemical surface analysis and depth profilingApplied Physics B Laser and Optics, 1977
- Mass spectroscopy of sputtered neutrals and its application for surface analysisSurface Science, 1974
- A New Technique for the Elemental Analysis of Thin Surface Layers of SolidsApplied Physics Letters, 1971
- Mass-Spectrometric Study of Sputtering of Single Crystals of GaAs by Low-Energy A IonsJournal of Applied Physics, 1967
- Secondary Positive Ion Emission from Metal SurfacesJournal of Applied Physics, 1959
- Sputtering of Surfaces by Positive Ion Beams of Low EnergyJournal of Applied Physics, 1958