Structures and dynamic behavior of catalyst model surfaces characterized by modern physical techniques
- 1 February 1998
- journal article
- Published by Springer Nature in Research on Chemical Intermediates
- Vol. 24 (2), 151-168
- https://doi.org/10.1163/156856798x00744
Abstract
This paper reports the visualization of mobile pyridine on the terraces and site-specific adsorption of pyridine on the particular step sites on a TiO2(110)-(1×1) surface by scanning tunneling microscopy (STM), the anisotropic structure and reactivity of molybdenum oxides dispersed on TiO2(110)-(1×1) characterized by polarization-dependent total-reflection fluorescence x-ray absorption fine structure (PTRF-EXAFS), and the energy dispersive and real-time images of Au mesh on Si(111) recorded by a new x-ray photoemission electron miscroscopy (XPEEM).Keywords
This publication has 36 references indexed in Scilit:
- Applications of X-Ray Absorption Fine Structure to Catalysts and Model SurfacesJournal de Physique IV, 1997
- Ag on Au/Si(111):mInterfacial interactions on a submicrometer scalePhysical Review B, 1997
- Relaxation of-() Using Surface X-Ray DiffractionPhysical Review Letters, 1997
- Evidence for the Tunneling Site on Transition-Metal Oxides: Ti(110)Physical Review Letters, 1996
- Atomic-Scale Surface Structures of TiO2(110) Determined by Scanning Tunneling Microscopy: A New Surface-Limited Phase of Titanium OxideBulletin of the Chemical Society of Japan, 1995
- Observation of Anisotropic Migration of Adsorbed Organic Species Using Nanoscale Patchworks Fabricated with a Scanning Tunneling MicroscopeLangmuir, 1994
- First-principles calculations of the energetics of stoichiometricsurfacesPhysical Review B, 1994
- A scanning tunneling microscope that operates at high pressures and high temperatures (430 K) and during catalytic reactionsCatalysis Letters, 1992
- A Raman and ultraviolet diffuse reflectance spectroscopic investigation of silica-supported molybdenum oxideThe Journal of Physical Chemistry, 1991
- Surface Studies by Scanning Tunneling MicroscopyPhysical Review Letters, 1982