On the profile of temperature dependent series resistance in Al/Si3N4/p-Si (MIS) Schottky diodes
- 31 March 2006
- journal article
- Published by Elsevier in Microelectronic Engineering
- Vol. 83 (3), 577-581
- https://doi.org/10.1016/j.mee.2005.12.013
Abstract
No abstract availableKeywords
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