Depth-Selective Conversion-Electron Mössbauer Spectroscopy
- 6 October 1980
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 45 (14), 1206-1209
- https://doi.org/10.1103/physrevlett.45.1206
Abstract
A high-resolution, electrostatic electron spectrometer combined with a Mössbauer spectrometer has been used to obtain depth-selective Mössbauer spectra from the surface region of an iron scatterer by detecting emitted conversion electrons at selected electron energies. Clear experimental evidence of a sharp depth resolution in the Mössbauer spectra is demonstrated for the first time, in accordance with theoretical predictions.
Keywords
This publication has 10 references indexed in Scilit:
- Depth selection by means of scattered electrons: Monte Carlo calculation of energy distributionNuclear Instruments and Methods, 1979
- On the interpretation and practical analysis of depth selective conversion electron Mössbauer spectraNuclear Instruments and Methods, 1979
- Analysis of the electron transport in conversion electron Mössbauer spectroscopy (CEMS)Nuclear Instruments and Methods, 1978
- An electrostatic spectrometer for conversion electron Mössbauer spectroscopyNuclear Instruments and Methods, 1978
- Electron Spectroscopy for Surface AnalysisPublished by Springer Nature ,1977
- ARE MONOLAYERS DETECTABLE BY CONVERSION ELECTRON MÖSSBAUER SPECTROSCOPY (CEMS) ?Le Journal de Physique Colloques, 1976
- A simple method for the analysis of depth-selective Mössbauer-effect measurementsNuclear Instruments and Methods, 1974
- Depth selective Mössbauer-effect measurements by means of scattered electronsNuclear Instruments and Methods, 1974
- An analysis of backscatter Mössbauer spectra obtained with internal conversion electronsNuclear Instruments and Methods, 1972
- Method of analysis of thin surface layers by the Mössbauer effectNuclear Instruments and Methods, 1969