Depth selective Mössbauer-effect measurements by means of scattered electrons
- 1 March 1974
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 115 (2), 373-380
- https://doi.org/10.1016/0029-554x(74)90235-3
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Depth selection by means of scattered electrons: A method to determine electron line profilesNuclear Instruments and Methods, 1973
- An analysis of backscatter Mössbauer spectra obtained with internal conversion electronsNuclear Instruments and Methods, 1972
- Analysis of Thin Surface Layers by Fe-57 Mössbauer Backscattering SpectrometryJournal of Applied Physics, 1970
- Method of analysis of thin surface layers by the Mössbauer effectNuclear Instruments and Methods, 1969
- DETERMINATION OF SURFACE COMPOUND FORMATION BY BACKSCATTER MÖSSBAUER SPECTROSCOPYApplied Physics Letters, 1968