A vacuum automatic ellipsometer for principal angle of incidence measurement
- 30 June 1980
- journal article
- Published by Elsevier in Surface Science
- Vol. 96 (1-3), 202-216
- https://doi.org/10.1016/0039-6028(80)90303-9
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Refractive indices of zinc sulfide and cryolite in multilayer stacksApplied Optics, 1976
- Principal angle-of-incidence ellipsometrySurface Science, 1976
- A Precision Ellipsometer without Employing a CompensatorJapanese Journal of Applied Physics, 1975
- Optimizing precision of rotating-analyzer ellipsometersJournal of the Optical Society of America, 1974
- High vacuum shaft seals, flanged joints and the gassing and the permeability of rubber-like materialsBritish Journal of Applied Physics, 1957
- The Optical Constants of Several Metals in Vacuum*Journal of the Optical Society of America, 1936