Analyse sous helium par la technique de fluorescence X induite par protons
- 28 December 1975
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 131 (3), 563-565
- https://doi.org/10.1016/0029-554x(75)90453-x
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Proton induced X-ray emission as a tool for trace element analysisNuclear Instruments and Methods, 1974
- Trace element analysis using proton-induced X-ray emission spectroscopyNuclear Instruments and Methods, 1974
- Quantitative X-ray analysisNuclear Instruments and Methods, 1972
- Preparation of thin film deposits from biological, environmental and other matterNuclear Instruments and Methods, 1971