A critique of the Kelvin method of measuring work functions
- 1 July 1970
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 3 (7), 477-482
- https://doi.org/10.1088/0022-3735/3/7/201
Abstract
No abstract availableKeywords
This publication has 53 references indexed in Scilit:
- The effects of stray capacitance on the Kelvin method for measuring contact potential differenceJournal of Physics D: Applied Physics, 1970
- A two frequency vibrating capacitor method for contact potential difference measurementsJournal of Physics E: Scientific Instruments, 1969
- Work Functions of Conductive Coatings on GlassReview of Scientific Instruments, 1969
- The structure of, and the contact potential difference between, polycrystalline tungsten foil and vapour-deposited films of tungsten on glassJournal of Physics D: Applied Physics, 1968
- Chemisorption on Single-Crystal Planes: Nitrogen on TungstenThe Journal of Chemical Physics, 1965
- The work function of polycrystalline tungsten foilProceedings of the Physical Society, 1965
- A static capacitor method for the measurement of the surface potential of gases on evaporated metal filmsJournal of Scientific Instruments, 1963
- A Direct Comparison of the Kelvin and Electron Beam Methods of Contact Potential MeasurementPhysical Review B, 1952
- XLII. Contact potentials.—Part II. The Volta effectJournal of Computers in Education, 1942
- XLI. Contact potentials.—Part I. General principlesJournal of Computers in Education, 1942