Direct Experimental Evidence for Molecular Hydrogen in Amorphous Si: H

Abstract
Molecular hydrogen in amorphous Si: H films prepared by glow discharge is detected calorimetrically at low temperatures from the heat release associated with the ortho-to-para conversion. The H2 concentration is much higher in samples prepared at 250°C (6.4 × 1019 cm3) than in those prepared at room temperature (2.4 × 1018 cm3). These results support a recent model of H1 nuclear spin relaxation via interaction with H2 molecules in a-Si: H and, in addition, give new insight into the structure of a-Si: H.