Time-Resolved Study of Silicon During Pulsed-Laser Annealing
- 1 January 1983
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Laser and Electron Beam Interactions with SolidsMRS Bulletin, 1982
- Synchrotron X-Ray Diffraction Study of Silicon during Pulsed-Laser AnnealingPhysical Review Letters, 1982
- Measurement of the Velocity of the Crystal-Liquid Interface in Pulsed Laser Annealing of SiPhysical Review Letters, 1982
- X-ray study of lattice strain in boron implanted laser annealed siliconJournal of Applied Physics, 1980
- Determination of strain distributions from X-ray Bragg reflexion by silicon single crystalsActa Crystallographica Section A, 1977