Selective area solution growth of Ge and GaAs on Si

Abstract
Ge and GaAs have been grown on Si substrates by selective area solution growth from saturated metal solutions. Prior to this work, the growth of GaAs on Si has been almost exclusively done by molecular-beam epitaxy or metalorganic chemical vapor deposition. A primary advantage of the solution growth process is the prospect for selective area growth where growth is limited solely to openings in a SiO2 mask. The selectively grown Ge and GaAs crystal compositions were determined by energy dispersive analysis by x ray with the GaAs material demonstrating stoichiometry without detectable Si or Ge incorporation. The GaAs crystals on Si were also fabricated into simple light-emitting diode structures that emitted infrared light at 0.7–0.8 V forward bias.