Trajectory overlaps and local magnification in three-dimensional atom probe
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- 22 May 2000
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 76 (21), 3127-3129
- https://doi.org/10.1063/1.126545
Abstract
Local magnification effects related to the presence of a second phase in three-dimensional atom probe have been investigated using a simulation of ion trajectories from the analyzed sample surface. Spherical precipitates containing only B atoms embedded in pure A solid solution were considered. The magnification was found to vary drastically from 0.5 to 2.0 times when the evaporation field of B was varied from to The trajectories were found to overlap over distances close to 1 nm only when the reduced evaporation field is outside of a gap ranging from 0.9 to 1.1. Simulations indicate that the “measured” composition in the inner core of precipitates is not biased in this gap. This is also the case for particles which have a diameter larger than a critical value of 2 nm.
Keywords
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