Sub‐micron molecular imaging. A viability study by time‐of‐flight SIMS
- 1 December 1988
- journal article
- Published by Wiley in Surface and Interface Analysis
- Vol. 13 (4), 181-185
- https://doi.org/10.1002/sia.740130403
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Interaction of ion beams with polymers, with particular reference to SIMSVacuum, 1986
- Analysis and chemical imaging of polymer surfaces by secondary ion mass spectroscopySpectrochimica Acta Part B: Atomic Spectroscopy, 1985
- A New Time-of-Flight Instrument for SIMS and Its Application to Organic CompoundsPublished by Springer Nature ,1984
- Analysis of polymer surfaces by SIMS, 3—preliminary results from molecular imaging and microanalysis experimentsSurface and Interface Analysis, 1983
- Multiple—focusing time of flight mass spectrometers Part I. Tofms with equal momentum accelerationInternational Journal of Mass Spectrometry and Ion Physics, 1971