On the mechanism of hFE degradation by emitter-base reverse current stress
- 1 September 1970
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 9 (5), 425-432
- https://doi.org/10.1016/0026-2714(70)90434-8
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
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