Enrichment depth profiles in polymer blends measured by forward recoil spectrometry
- 6 February 1989
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 54 (6), 590-592
- https://doi.org/10.1063/1.100888
Abstract
A novel time-of-flight detector system for He+ forward recoil spectrometry which improves the depth resolution to better than 35 nm has been used to investigate the form of the surface enrichment profile in a protonated (normal) polystyrene (PS)/deuterated polystyrene (d-PS) blend. The volume fraction φ of d-PS depends on the depth z as φ(z)=φ∞+(φ1−φ∞) exp(−z/ξ), where φ1 and φ∞ are the surface and bulk volume fractions of d-PS, respectively, and ξ is approximately the bulk correlation length, as predicted by theory.Keywords
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