A differential scanning calorimetry study of solid state amorphization in multilayer Ni/Zr
- 31 January 1988
- journal article
- Published by Elsevier in Materials Science and Engineering
- Vol. 97, 83-86
- https://doi.org/10.1016/0025-5416(88)90016-x
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Differential scanning calorimetry study of solid-state amorphization in multilayer thin-film Ni/ZrApplied Physics Letters, 1987
- Calorimetric Study of Amorphization in Planar, Binary, Multilayer, Thin-Film Diffusion Couples of Ni and ZrPhysical Review Letters, 1986
- Solid-state reaction and structure in compositionally modulated zirconium-nickel and titanium-nickel filmsPhysical Review B, 1986
- The thermalization of energetic atoms during the sputtering processJournal of Vacuum Science & Technology A, 1984