Site-Specific Valence Determination by Electron Energy-Loss Spectroscopy
- 22 February 1982
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 48 (8), 560-563
- https://doi.org/10.1103/physrevlett.48.560
Abstract
The valence of an atom occupying a particular crystal lattice site can be determined from the chemical shift in a transmission electron energy-loss spectrum obtained with the intensity of the incident electron wave maximized at that site by dynamical electron diffraction. The new technique is demonstrated by determining the location of and ions in a mixed-valence spinel.
Keywords
This publication has 7 references indexed in Scilit:
- X-Ray Standing Waves at Crystal SurfacesPhysical Review Letters, 1980
- X-Ray SpectroscopyPublished by Springer Nature ,1979
- Lattice Location by Channeling Angular Distributions: Bi Implanted in SiPhysical Review B, 1972
- Detection of Foreign Atom Sites by Their X-Ray Fluorescence ScatteringPhysical Review Letters, 1969
- Effect of Dynamical Diffraction in X-Ray Fluorescence ScatteringPhysical Review B, 1964
- Enhanced X-ray emission from extinction contours in a single-crystal gold filmPhilosophical Magazine, 1962
- On the production of X-rays in thin metal foilsPhilosophical Magazine, 1962