Electron Microscopical Replica Techniques for the Study of Organic Surfaces
- 1 November 1945
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 16 (11), 730-739
- https://doi.org/10.1063/1.1707528
Abstract
The problem of examining opaque surfaces in the electron microscope is discussed and it is shown that none of the methods heretofore described is completely satisfactory for the examination of organic surfaces. Two new methods, a low pressure polystyrene-silica technique and a silver-silica double evaporation method, are described and it is demonstrated that they allow observation of organic as well as metallurgical surfaces. Electron micrographs of fiber surfaces, biological material, paint films, ores, and metals are included to illustrate the utility of these techniques.Keywords
This publication has 9 references indexed in Scilit:
- Techniques in Applied Electron Microscopy*Journal of the Optical Society of America, 1945
- Electron Microscopic Determination of Surface Elevations and OrientationsJournal of Applied Physics, 1944
- Electron Microscope and CelluloseIndustrial & Engineering Chemistry, 1943
- Fine Structure of Metallic Surfaces with the Electron MicroscopeJournal of Applied Physics, 1943
- The Electron MicroscopeIndustrial & Engineering Chemistry, 1942
- Electron Microscope Study of Surface StructurePhysical Review B, 1942
- Surface Replicas for Use in the Electron MicroscopeJournal of Applied Physics, 1942
- Surface Studies with the Electron MicroscopeJournal of Applied Physics, 1941
- Das Elektronen-RastermikroskopZeitschrift für Physik, 1938