Application software for data analysis for three-dimensional atom probe microscopy
- 15 April 2002
- journal article
- Published by Elsevier in Materials Science and Engineering: A
- Vol. 327 (1), 29-33
- https://doi.org/10.1016/s0921-5093(01)01887-1
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Analysis of Three-dimensional Atom-probe Data by the Proximity HistogramMicroscopy and Microanalysis, 2000
- Trajectory overlaps and local magnification in three-dimensional atom probeApplied Physics Letters, 2000
- Atomic-scale study of second-phase formation involving large coherency strains in Fe–20 at.% MoScripta Materialia, 2000
- Performance of an energy-compensated three-dimensional atom probeReview of Scientific Instruments, 1998
- The tomographic atom probe: A quantitative three-dimensional nanoanalytical instrument on an atomic scaleReview of Scientific Instruments, 1993
- Marching cubes: A high resolution 3D surface construction algorithmACM SIGGRAPH Computer Graphics, 1987