EBT: A Comprehensive Test Generation Technique for Highly Sequential Circuits
- 1 January 1978
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
A new test generation technique for highly sequential circuits, utilizing functional models, with ability to produce tests for specific faults while avoiding races, is presented.Keywords
This publication has 6 references indexed in Scilit:
- CDALGO - a test pattern generation programPublished by Association for Computing Machinery (ACM) ,1976
- LAMP: Automatic Test Generation for Asynchronous Digital CircuitsBell System Technical Journal, 1974
- A Heuristic Algorithm for the Testing of Asynchronous CircuitsIEEE Transactions on Computers, 1971
- Programmed Algorithms to Compute Tests to Detect and Distinguish Between Failures in Logic CircuitsIEEE Transactions on Electronic Computers, 1967
- Diagnosis of Automata Failures: A Calculus and a MethodIBM Journal of Research and Development, 1966
- On Finding a Nearly Minimal Set of Fault Detection Tests for Combinational Logic NetsIEEE Transactions on Electronic Computers, 1966