Abstract
The separation and examination of oxide films of 100–200 Å thickness from magnesium single crystals is described. The film separation is accomplished by sublimation of the metal crystal, leaving large areas of the oxide film intact at the sublimation site. Electron microscopy and selected‐area diffraction have been used to determine the continuity, crystallite size, and epitaxy of the oxide films. This information is particularly useful in establishing a mechanism for the kinetics of oxide‐film growth described in Part I.