Magnetic behaviour of narrow track thin-film heads
- 1 March 1981
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 52 (3), 2462-2464
- https://doi.org/10.1063/1.328967
Abstract
The influence of the trackwidth on the performance of thin film heads has been tested. Results of experiments on the wafer have indicated an increase in the head efficiency with decreasing trackwidth. This was underlined by measurements of the head fringe field and tape recording experiments. A model which takes the domain structure into account has been developed to interpret this behaviour.Keywords
This publication has 4 references indexed in Scilit:
- Investigation of the structure of recording head fieldsIEEE Transactions on Magnetics, 1979
- Wafer testing of thin film record and reproduce headsIEEE Transactions on Magnetics, 1979
- Recording head field measurement with a magnetoresistive transducerIEEE Transactions on Magnetics, 1978
- Analysis of the Efficiency of Thin-Film Magnetic Recording HeadsJournal of Applied Physics, 1971