Anomalous Width of Some Photoexcitation Lines of Impurities in Silicon
- 2 October 1967
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 19 (14), 781-783
- https://doi.org/10.1103/physrevlett.19.781
Abstract
DOI: https://doi.org/10.1103/PhysRevLett.19.781Keywords
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