Elemental mapping at the atomic scale using low accelerating voltages
- 31 July 2010
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 110 (8), 926-934
- https://doi.org/10.1016/j.ultramic.2010.03.008
Abstract
No abstract availableThis publication has 24 references indexed in Scilit:
- Higher-order aberration corrector for an image-forming system in a transmission electron microscopeUltramicroscopy, 2010
- Structure and bonding at the atomic scale by scanning transmission electron microscopyNature Materials, 2009
- Performance Advantages of a Modern, Ultra-High Mass Resolution Atom ProbeMicroscopy and Microanalysis, 2008
- Element-selective imaging of atomic columns in a crystal using STEM and EELSNature, 2007
- Two-Dimensional Mapping of Chemical Information at Atomic ResolutionPhysical Review Letters, 2007
- Towards sub-0.5Å electron beamsUltramicroscopy, 2003
- Towards sub-Å electron beamsUltramicroscopy, 1999
- A spherical-aberration-corrected 200kV transmission electron microscopeUltramicroscopy, 1998
- Electron microscopy image enhancedNature, 1998
- Towards 0.1 nm resolution with the first spherically corrected transmission electron microscopeJournal of Electron Microscopy, 1998