Procedures for focusing, stigmating and alignment in high resolution electron microscopy
- 1 May 1983
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 130 (2), 187-201
- https://doi.org/10.1111/j.1365-2818.1983.tb04217.x
Abstract
No abstract availableKeywords
This publication has 19 references indexed in Scilit:
- On‐line image processing in high resolution electron microscopyJournal of Microscopy, 1982
- An automatic focusing and astigmatism correction system for the SEM and CTEMJournal of Microscopy, 1982
- Units and conventions in electron microscopy, for use in ultramicroscopyUltramicroscopy, 1980
- The Role of Correlation Techniques in Computer Image ProcessingPublished by Springer Nature ,1980
- A tv system for image recording and processing in conventional transmission electron microscopyUltramicroscopy, 1978
- Accurate stigmating of a high voltage electron microscopeJournal of Microscopy, 1977
- Phototitus: image intensifier and converter for an electron microscopeJournal of Physics E: Scientific Instruments, 1977
- Controlled focusing and stigmating in the conventional and scanning transmission electron microscopeJournal of Physics E: Scientific Instruments, 1975
- Signal-to-noise ratio of electron micrographs obtained by cross correlationNature, 1975
- Wirkungsquerschnitte für elastische und unelastische Elektronenstreuung an amorphen Kohlenstoff- und GermaniumschichtenThe European Physical Journal A, 1965