Position of the degradation and the improved structure for the buried crescent InGaAsP/InP (1.3 μm) lasers

Abstract
We have found a degradation of the buried crescent (BC) InGaAsP/InP lasers that occurs when the p-n junction plane coincides with the surface exposed in the high-temperature H2 ambient before the melt contact during the liquid phase epitaxial growth. To eliminate the degradation, we have fabricated a new structure of the BC laser and have obtained stable cw operation at 80 °C.