Automated system for the characterization of high resistivity semiconductors by the van der Pauw method
- 1 July 1981
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 52 (7), 1047-1050
- https://doi.org/10.1063/1.1136732
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Photocapacitance of deep levels in GaAs:Cr and GaAs:OSolid-State Electronics, 1978
- On the characterization of semi-insulating gaas by hall, photo-hall, photoconductivity, and photomagnetoelectric measurementsJournal of Electronic Materials, 1978
- On the interpretation of photoconductivity and photo-hall spectra in semi-insulating GaAs:CrSolid State Communications, 1977
- The electrical characterization of semi-insulating GaAs: A correlation with mass-spectrographic analysisJournal of Applied Physics, 1977
- Mixed conduction in Cr-doped GaAsJournal of Physics and Chemistry of Solids, 1975
- Measurement of High Resistivity Semiconductors Using the van der Pauw MethodReview of Scientific Instruments, 1973