Generation-recombination noise in double-injection diodes
- 30 November 1969
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 12 (11), 849-856
- https://doi.org/10.1016/0038-1101(69)90041-0
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Noise and Equivalent Circuit of Double InjectionJournal of Applied Physics, 1968
- The decomposition of the transport noise under space charge conditions in solidsPhysica, 1968
- Effects of Diffusion and Thermal Generation on Double Injection in SemiconductorsJournal of Applied Physics, 1968
- On the Double Injection Current Noise in SolidsPhysica Status Solidi (b), 1968
- Effects of Diffusion on Double Injection in InsulatorsPhysical Review B, 1965
- Generation Recombination Noise in Intrinsic and Near-Intrinsic Germanium CrystalsJournal of Applied Physics, 1958