Channelling contrast on metal surfaces after ion beam etching
Open Access
- 1 January 1981
- Vol. 4 (2), 91-93
- https://doi.org/10.1002/sca.4950040205
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Detector system for backscattered electrons by conversion to secondary electronsScanning, 1979
- The Orientation Dependence of the Electron Backscattering Coefficient of Gold Single Crystal FilmsZeitschrift für Naturforschung A, 1974
- Application of ion sputtering in preparing glasses and their surface layers for electron microscope investigationsJournal of Non-Crystalline Solids, 1970