Determination of multiple lattice parameters from convergent-beam electron diffraction patterns
- 31 May 1993
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 50 (1), 41-56
- https://doi.org/10.1016/0304-3991(93)90089-g
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
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