High-voltage probe system with subnanosecond rise time

Abstract

A high‐voltage probe measuring system with an overall rise time of less than 50 psec and a peak voltage capability of 20 kV has been developed. Probe perturbations at the 50 Ω impedance level are minimized by maintaining a moderately high input impedance, in conjunction with the absorption of internal reflection waves by means of a lossy distributed transmission line. System long‐term stability and constructional reproducibility have been investigated.