Localization of absorption losses in oxide single-layer films
- 1 January 1987
- journal article
- Published by EDP Sciences in Journal de Physique
- Vol. 48 (3), 419-424
- https://doi.org/10.1051/jphys:01987004803041900
Abstract
Absorption measurements performed by means of photoacoustic absorption (PAA)-technique in wedge-shaped TiO2' Ta2O5, and ZrO2 single-layer films at λ = 488 nm, 515 nm, and 647 nm permit a separate determination of bulk and interface absorption, respectively. For TiO2 and Ta2O5 films investigated the film-substrate interface absorption Afs dominates over the air-film interface absorption Aaf, whereas for evaporated ZrO2 films both the interface contributions are nearly the same. In addition, preliminary results concerned with the wavelength dependence of the absorption of the films investigated are presentedKeywords
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