How to analyse relaxation and leakage currents of dielectric thin films: Simulation of voltage-step and voltage-ramp techniques
- 1 May 1995
- journal article
- Published by Taylor & Francis in Integrated Ferroelectrics
- Vol. 8 (3-4), 317-332
- https://doi.org/10.1080/10584589508219666
Abstract
No abstract availableKeywords
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