Measurement of the Gibbsian interfacial excess of solute at an interface of arbitrary geometry using three-dimensional atom probe microscopy
- 6 December 2001
- journal article
- Published by Elsevier in Materials Science and Engineering: A
- Vol. 327 (1), 24-28
- https://doi.org/10.1016/s0921-5093(01)01885-8
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Analysis of Three-dimensional Atom-probe Data by the Proximity HistogramMicroscopy and Microanalysis, 2000
- Three-dimensional Investigation of Ceramic/Metal Heterophase Interfaces by Atom-probe MicroscopyMicroscopy and Microanalysis, 2000
- Trajectory overlaps and local magnification in three-dimensional atom probeApplied Physics Letters, 2000
- Phosphorus segregation in nanocrystalline Ni–3.6 at.% P alloy investigated with the tomographic atom probe (TAP)Acta Materialia, 2000
- Performance of an energy-compensated three-dimensional atom probeReview of Scientific Instruments, 1998
- The tomographic atom probe: A quantitative three-dimensional nanoanalytical instrument on an atomic scaleReview of Scientific Instruments, 1993
- Curvature corrections to the surface tension of fluid drops: Landau theory and a scaling hypothesisPhysical Review B, 1984