Optical measurement of oxide films on zirconium in the range of wavelengths from 2000 to 2·5 μ
- 31 December 1965
- journal article
- Published by Elsevier in Corrosion Science
- Vol. 5 (1), 3-18
- https://doi.org/10.1016/s0010-938x(65)90036-3
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
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- Optical absorption in very thin dielectric films and its originJournal de Physique, 1964
- Détermination par spectrophotométrie par immersion des constantes optiques de films interférentiels d'oxyde anodique sur support en tantaleJournal de Physique, 1964
- Fluoride Interference Films on Uranium Dioxide. I. The Kinetically Derived Optical EquationThe Journal of Chemical Physics, 1963
- Immersion Spectrophotometry of Interference Films: Refractive Indices of Fluoride Films on Uranium Dioxide and Anodic Oxide Films on Uranium Metal*Journal of the Optical Society of America, 1963
- On the oxidation of thin films of zirconiumJournal of Nuclear Materials, 1963
- The Effect of Electrolyte Composition on the Anodic Oxidation of ZirconiumJournal of the Electrochemical Society, 1962
- On the Preparation of Hard Oxide Films with Precisely Controlled Thickness on Evaporated Aluminum Mirrors*Journal of the Optical Society of America, 1949