X-ray scattering from adsorbed xenon monolayer films

Abstract

The x-ray diffraction patterns of xenon adsorbed on spheron have been measured at 175°K for surface coverages from $\theta =0.1\mathrm{} \mathrm{to} 1.05$. Continuous patterns of a liquidlike character are obtained, without any obvious change in the structure of the adsorbed film with coverage. Atomic distribution functions were calculated by Fourier transforming the xenon structure factor. Theoretical arguments are advanced concerning these distribution functions and structure factors. It is concluded that the adsorbed films show no sign of registry with the surface lattice or long-range two-dimensional order under the experimental conditions of this study.