Abstract
Low‐resistivity n‐type ZnSe with pn≳1017 cm−3 has been grown epitaxially on (100) GaAs substrates by a low‐pressure low‐temperature organometallic chemical vapor deposition process. Triethylaluminum is used as a dopant. The as‐grown layers show a strong near‐band‐gap photoluminescence peak. The much weaker photoluminescence intensity at longer wavelength indicates that the concentration of deep centers is lower than in doped ZnSe prepared by other methods.