Symmetry of Interface Charge Distribution in Thermally Oxidized Silicon
- 3 April 1967
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 18 (14), 543-546
- https://doi.org/10.1103/physrevlett.18.543
Abstract
DOI:https://doi.org/10.1103/PhysRevLett.18.543Keywords
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