Measures of the Effectiveness of Fault Signature Analysis
- 1 June 1980
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-29 (6), 510-514
- https://doi.org/10.1109/tc.1980.1675610
Abstract
A linear feedback shift register can be used to compress a serial stream of test result data. The compressed erroneous bit stream caused by a fault is said to form the "signature" of the fault. Since the bit stream is compressed, however, it is possible for an erroneous bit stream and the correct one to result in the same signature.Keywords
This publication has 4 references indexed in Scilit:
- Testing by Feedback Shift RegisterIEEE Transactions on Computers, 1980
- Transition Count Testing of Combinational Logic CircuitsIEEE Transactions on Computers, 1976
- An Advanced Fault Isolation System for Digital LogicIEEE Transactions on Computers, 1975
- Error correcting codes and their implementation for data transmission systemsIEEE Transactions on Information Theory, 1961