Metallurgical boundary properties and electrophysical properties of molybdenum-silicon junctions
- 1 August 1977
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 45 (1), 87-93
- https://doi.org/10.1016/0040-6090(77)90208-5
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Investigation of phase-growth kinetics during interaction of silicon single crystals and molybdenum thin filmsTalanta, 1977
- Investigation of phase growth kinetics in the system of Si single crystals and V thin filmsPhysica Status Solidi (a), 1976
- Investigation of reactive diffusion in the thin-film system Cu-TiPhysica Status Solidi (a), 1975
- p Layers on Vacuum Heated SiliconJournal of Applied Physics, 1960