InAs quantum dot infrared photodetectors with In0.15Ga0.85As strain-relief cap layers

Abstract
We report InAs quantum dot infrared photodetectors that utilize In 0.15 Ga 0.85 As strain-relief cap layers. These devices exhibited normal-incidence photoresponse peaks at 8.3 or 8.8 μm for negative or positive bias, respectively. At 77 K and −0.2 V bias the responsivity was 22 mA/W and the peak detectivity D * was 3.2×10 9 cm Hz 1/2 / W .

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